The Board for Certification of Genealogists (BCG) will offer a day of free skillbuilding genealogy lectures at the LDS Church History Museum, Salt Lake City, 9 October 2015.
Renowned genealogists Jeanne Larzalere Bloom, Michael Hait, Thomas W. Jones, Elizabeth Shown Mills, Michael Ramage, and Judy G. Russell will present six one-hour skillbuilding lectures. The annual lectures, co-sponsored by BCG and the Family History Library, are free and open to the public. Anyone in Salt Lake City on that day is welcome to attend. The lectures will be presented live.
Friday, October 9, 2015, Church History Museum Auditorium (on West Temple next to the Family History Library)
9:00 a.m. –
“What Is 'Reasonably Exhaustive Research’?” Michael Hait, CG
10:15 a.m. –
“The Art of Negative Space Research: Women,” Jeanne Larzalere Bloom, CG
11:30 a.m. –
“After the Courthouse Burns: Rekindling Family History Through DNA,” Judy G. Russell, JD, CG, CGL
12:30 p.m. –
One hour break
1:30 p.m. –
“Forensic Genealogy Meets the Genealogical Proof Standard,” Michael Ramage, JD, CG
2:45 p.m. –
“Margaret’s Baby’s Father and the Lessons He Taught Me (about Illegitimacy, Footloose Males, Burned Counties & More),” Elizabeth Shown Mills, CG, CGL, FASG, FNGS, FUGA
4:00 –
“When Does Newfound Evidence Overturn a Proved Conclusion?” Thomas W. Jones, PhD, CG, CGL, FASG, FNGS, FUGA
“Whether you attend one skillbuilding lecture or all six, you will learn more about how to apply sound methodology to your genealogical research,” said BCG President Jeanne Larzalere Bloom. “The Board for Certification of Genealogists strives to foster public confidence in genealogy by promoting an attainable, uniform standard of competence and ethics. Education is part of this mission.”
For questions or more information contact
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CG, Certified Genealogist, CGL, and Certified Genealogical Lecturer, are service marks of the Board for Certification of Genealogists, used under license by Board-certified genealogists after periodic competency evaluation, and the board name is registered in the US Patent & Trademark Office.
